Aspen Test Engineering Fixture Buyback Program we will recycle your old fixtures ict test fixtures genrad
Please call for a quote ict test fixture programs
Aspen Test Engineering Fixture Buyback Program we will recycle your old fixtures ict test fixtures genrad
Please call for a quote ict test fixture programs
Aspen Test Engineering Provides
Micro Controller Test Model Offerings / PIC18F Series
Micro Controllers with both full pin wiggle test and In System Programming.
Features
In System Programming routine compatible with TS12X or GR228Xi with any DSM. ICA not required for some models.
The device with the largest flash in the series (128K bytes) programs in about 9.7 seconds. Already confirmed.
The only DFT required will be design for In-System Programmability with probe access to the ISP pins.
Pin Test Routine
Tester programs a pin-test firmware on the 1st burst and executes the pin test on the next
burst.
Fault coverage using /OR_BIDIR about 100%.
Pin-level diagnostics, same diagnostics routine as Boundary-Scan.
Any pins in the chain may be tied to VCC, GND or together. No-access pins do not Pin tests in PIC assembly language. Source code embedded in the HTS as comments.
PIC18F2XXX/4XXX Series
PIC18F2XXX/4XXX series. 2 Primes and 4 packages will cover these 46 devices. Different devices can be alias. Differences such as flash size and address of configuration space are automatically deter- mined by use of “#if DutType()”.
Least complex, available in 28-pin SDIP, PDIP, SOIC, SSOP and QFN package
PIC18F2221 PIC18F2523 PIC18F2321 PIC18F2525 PIC18F2410 PIC18F2550 PIC18F2420 PIC18F2553 PIC18F2423 PIC18F2580 PIC18F2450 PIC18F2585 PIC18F2455 PIC18F2610 PIC18F2458 PIC18F2620 PIC18F2480 PIC18F2680 PIC18F2510 PIC18F2682 PIC18F2515 PIC18F2685 PIC18F2520
Most complex, available in 40-pin PDIP and 44-pin TQFP and QFN Package.
PIC18F4221 PIC18F4523 PIC18F4321 PIC18F4525 PIC18F4410 PIC18F4550 PIC18F4420 PIC18F4553 PIC18F4423 PIC18F4580 PIC18F4450 PIC18F4585 PIC18F4455 PIC18F4610 PIC18F4458 PIC18F4620 PIC18F4480 PIC18F4680 PIC18F4510 PIC18F4682 PIC18F4520 PIC18F4685 PIC18F4515
PIC18F67J50 PIC18F66F15 PIC18F65J11PIC18F67J11 PIC18F66J11 PIC18F65J10 PIC18F67J10 PIC18F66J10 PIC18F64J90 PIC18F66J55 PIC18F65J90 PIC18F64J11 PIC18F66J50 PIC18F65J50 PIC18F63J90 PIC18F66J16 PIC18F65J15 PIC18F63J11
Aspen Test Engineering, I nc. 1200 Diamond Circle, Suite C, Lafayette, CO 80026
www.aspentest.com TEL (303) 665-2324, FAX (303) 665-1426
Aspen Test Engineering Provides
Micro Controller Test Model Offerings / PIC18F Series
Micro Controllers with both full in wiggle test and In System Programming.
PIC18F6XJXX/8XJXX Series
PIC18F6XJXX/8XJXX series, 2 Primes will cover these 36 devices. Different devices can be alias. Dif-
ferences such as flash size and address of configuration space are automatically determined by use of “#if DutType()”.
Least complex available in 64-pin TQFP Most complex available in 80-pin TQFP
PIC18F87J50 PIC18F86F15 PIC18F85J11 PIC18F87J11 PIC18F86J11 PIC18F85J10 PIC18F87J10 PIC18F86J10 PIC18F84J90 PIC18F86J55 PIC18F85J90 PIC18F84J11 PIC18F86J50 PIC18F85J50 PIC18F83J90 PIC18F86J16 PIC18F85J15 PIC18F83J11
A DOS based C++ routine will be developed that will convert Intel HEX files to .DDS.
The DSM data needs to be presented to the PIC micro 1-bit wide LSB->MSB. Flashtool does not support such an output.
Price Range from $2,500.00 to $5,000.00
Call David Kufta at 678.797.5566 or email sales@aspentest.com today to discuss your existing or future programming and fixture needs.
Aspen Test Engineering
Aspen Test Engineering 1200 Diamond Circle, Suite C Lafayette, CO, 80026 US
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